The MXA is built for speed: it helps you shorten test times with capabilities such as rapid local measurements, display updates, and marker peak searches. Fast sweep speed optimizes your spurious measurements. It’s also built for performance: you can accurately characterize device performance by measuring small signals in the presence of large ones with up to 116 dB (typical) third-order dynamic range. The best-in-class phase noise (–114 dBc/Hz at 10 kHz offset) enables you to achieve the lowest internal EVM floor for cellular communication standards like LTE. With deep capture memory, you can perform thorough signal characterization by capturing longer I/Q samples from signals-under-test.

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Simultaneous noise figure and gain measurements
Easy characterization of amplifiers and frequency converting devices

Option H18: INPUT FREQUENCY RANGE 10 to 1800MHz

NOISE FIGURE 10 to 1600MHz

< 7dB +0.003dB/MHz 1600 to 1800MHz < 14dB

Agilent Keysight 8970B – Noise Figure Meter, 10 MHz to 1600 MHz with Option H18

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Automated and compliant jitter tolerance testing allows quick and accurate characterization for all popular serial bus standards, such as PCIeTM, SATA, FB-DIMM, Fibre Channel, CEI, Gigabit Ethernet and XFP/XFI. The J-BERT matches to latest serial bus interfaces perfectly with its ability to analyze undeterministic traffic, generate complex pattern sequences, subrate clock outputs. Clockless and differential interfaces can be tested.

The J-BERT is an expandable, future-proof BERT platform where all options can be configured to the current test needs and upgraded later when those needs change.

It is the ideal choice for R&D and validation teams who characterize and stress chips and transceiver modules with serial I/O ports up to 12.5 Gb/s.

Agilent HP Keysight N4903A – with Options C13, J10 and J20 High Performance Serial BERT

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The MP1800A supports wideband bit rates from 0.1 to 32.1 Gbit/s for versatile signal integrity analysis applications up to 32 Gbit/s, such as 100GbE (25G x 4), OTU-4 (28G x 4), 32G DP-QPSK, CEI-28G, 32G FC, and Infiniband EDR (26 G). Combination with the MP1821A and MP1822A supports BER tests up to 56 Gbit/s for next-generation R&D, including CEI-56G-VSR.

1, 2, or 4 channels can be selected per PPG or ED module, supporting multi-channel synchronization for up to 8 channels at 32 Gbit/s. AOC, QSFP+, CXP and CFP modules can be measured simultaneously, and crosstalk and skew tolerance can be evaluated.

Combined use with the MP1825B 4Tap Emphasis generates 2 and 3-tap pre-emphasis signals for high-speed interconnects up to 32.1 Gbit/s, such as CEI-28G, 32G FC and Infiniband EDR (26G), as well as 4-tap signals. The pre-emphasis effect is easily confirmed because each tap can be changed independently.
Installing the MP1825B 4Tap emphasis as a remote head for the MP1800A close to the DUT keeps cables short and signal quality high. Precision signal integrity analysis is supported by pre-emphasis corrected accurate Jitter Tolerance tests with transparent input data and clock jitter .

The all-in-one MP1800 series outputs high-amplitude signals up to 3.5 Vp-p for evaluation of EA and EML modulators, improving optical modulator R&D, line productivity, and quality.
With support for optical interfaces, the MP1800A is ideal for IEEE802.3-2005 10GBASE-L and E stressed receiver conformance tests. The high-accuracy auto-calibration function assures excellent measurement reproducibility and interconnectivity.
In addition to generating IEEE and ITU-T burst data and auxiliary signals for evaluating E-PON, G-PON, and 10GE-PON optical modules, automated timing of the burst data and auxiliary signal outputs shortens evaluation times and increases evaluation quality.

Accessories

Options

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